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|a 9780470027851
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|a 620.2
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| 100 |
1 |
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|a Brandon, David.
|9 305042
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| 245 |
1 |
0 |
|a Microstructural characterization of materials /
|c David Brandon; Wayne D. Kaplan.
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| 250 |
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|a 2nd ed.
|
| 260 |
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|a West Sussex :
|b John Wiley and Sons,
|c 2008.
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| 300 |
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|a xiv; 536 p. :
|b figuras
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| 520 |
2 |
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|a The concept of microstructure - Diffraction analysis of crystal structure - Optical microscopy - Transmission electron microscopy - Scanning electron microscopy - Microanalysis in electron microscopy - Scanning probe microscopy and related techniques - Chemical analysis of surface composition - Quantitative and tomographic analysis of microstructure - Appendices.
|
| 650 |
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4 |
|a MICROESTRUCTURAS
|9 269388
|
| 650 |
|
4 |
|a MICROSCOPIA OPTICA
|9 302662
|
| 650 |
|
4 |
|a MICROSCOPIA ELECTRONICA
|9 268950
|
| 650 |
|
4 |
|a MATERIALES
|9 262896
|
| 700 |
1 |
|
|a Kaplan, Wayne D.
|9 305043
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| 929 |
|
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|a 41538 COM Tesoro Nacional 2015
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| 942 |
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|c LIB
|6 _
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| 999 |
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|a GEB
|c 19019
|d 19019
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