Microstructural characterization of materials /

Detalles Bibliográficos
Autor Principal: Brandon, David
Otros autores o Colaboradores: Kaplan, Wayne D.
Formato: Libro
Lengua:inglés
Datos de publicación: West Sussex : John Wiley and Sons, 2008.
Edición:2nd ed.
Temas:
Resumen:The concept of microstructure - Diffraction analysis of crystal structure - Optical microscopy - Transmission electron microscopy - Scanning electron microscopy - Microanalysis in electron microscopy - Scanning probe microscopy and related techniques - Chemical analysis of surface composition - Quantitative and tomographic analysis of microstructure - Appendices.
Descripción Física:xiv; 536 p. : figuras
ISBN:9780470027851