Handbook of sample preparation for scanning electron microscopy and X-ray microanalysis /
Autor Principal: | |
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Formato: | Libro |
Lengua: | inglés |
Datos de publicación: |
New York :
Springer,
2010.
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Temas: | |
Resumen: | Introduction - Sample collection and selection - Sample preparation tools - Sample support - Sample embedding and mounting - Sample exposure - Sample dehydration - Sample stabilization for imaging in the SEM - Sample stabilization to preserve chemical identity - Sample cleaning - Sample surface charge elimination - Sample artifacts and damage - Additional sources of information. |
Descripción Física: | 330 p. : figuras, tablas |
ISBN: | 9781441946744 |