Handbook of sample preparation for scanning electron microscopy and X-ray microanalysis /

Detalles Bibliográficos
Autor Principal: Echlin, Patrick
Formato: Libro
Lengua:inglés
Datos de publicación: New York : Springer, 2010.
Temas:
MICROSCOPIA
MICROANALISIS
RAYOS X
PREPARACION DE MUESTRAS
MICROSCOPIA DE BARRIDO
MANUALES
Resumen:Introduction - Sample collection and selection - Sample preparation tools - Sample support - Sample embedding and mounting - Sample exposure - Sample dehydration - Sample stabilization for imaging in the SEM - Sample stabilization to preserve chemical identity - Sample cleaning - Sample surface charge elimination - Sample artifacts and damage - Additional sources of information.
Descripción Física:330 p. : figuras, tablas
ISBN:9781441946744

MARC

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